Raman Imaging microscope – AFM

Equipment was financed by EU (ESRD) funds through the operation of the Center of Excellence in Nanoscience and Nanotechnology, Nanocenter 2009 – 2013.

TERS (Tip enhanced Raman spectroscopy) ready imaging Raman microscope – NT-MDT model »Integra Spectra for Material Science« provides »the same spot« coupled confocal Raman – AFM measurements  with atomic resolution on samples of 50×50 mm size. Raman excitation lines at 488, 632.8 and 785 nm are available. Measurements are possible in the temperature range from 3.4 K to 500 K and at reduced pressure down to high vacuum (10^-8 mbar).

Manufacturer`s Home page: http://www.ntmdt.com/

Applications: Materials, Electronics, Thin films, MEMS/NEMS, Biotechnology, Medicine, Pharmaceutical products

Modes of operation:
AFM modes: contact AFM, LFM, resonant mode, phase imaging, MFM, EFM, adhesion force imaging, AFM lithography mode, force versus distance curves for adhesion, stifness and dissipation, spreding resistance Imaging, AFM litography – voltage, SCI (in air), scanning Kelvin probe microscopy (in air).
SNOM modes: SNOM fiber access to HV chamber for irradiation of sample close to cantilever probe of AFM
Laser confocal measuring modes: scanning confocal Raman, scanning confocal fluorescence, scanning confocal laser microscopy, scanning confocal Raman at cryo temperatures.

Responsible person: Damjan Vengust, damjan.vengust@ijs.si
Equipment location: Laboratory B-S, Jožef Stefan Institute, Jamova cesta 39, 1000 Ljubljana
Requested level of experience: New users have to be supervised by an experienced user. Reservation are mandatory.
Useful reading: Nika Šturm, Tip-enhanced Raman Spectroscopy, Seminar, 2019, UL FMF